fei tecnai f20 manual
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DoProcedure:Gently tap the other side of the holderOrient the nut such that theThe holder is now ready to be loaded into the microscope.The holder is supported by the compustage ganiometer which controls specimen position in the x,y,z, and ?Procedure:Valves Closed button will be lit in yellow under the. Vacuum panel in microscope control. This can also be confirmed by looking in the vacuum overview tab andThe X,Y,Z, ? and ? positions will all be around zero.Do not touch the holder above the O-ring.Very little force is required to complete this task.Follow the instructions.This will take approximately 5 minutes total.The following conditions listed below should be met before microscope operation:Procedure:V7 valve is closed.Using both thumbs on the shaft provides the optimalPurpose: The trapped gases on the cold finger must be released during the end of the day to ensure good vacuumIf there are no other users on the microscope for the rest of the day this procedureProcedure:At the end of session the user must shutdown the software.Close in the order listed below:TEM AlignmentPurpose: This procedure will center the condenser aperture down the optical axis. The proper alignment of thisConvenience, changing strength of condenser lens does not change beamCenter C2 Procedure:C1 Procedure (Only for aperture numbers 1, 2 and 3). The C1 aperture is used for EDS, EELS, and other advanced data collection. For most cases the C1 aperture will notNotes:Purpose: To ensure that the illuminating beam is circular. This allows for easier alignments of other componentsProcedure:Notes:Purpose: Important for having maximum beam intensity. Adjusts the gun deflection coils so that the electron beam isThis ensures that all the electrons produced can be used for imaging. Procedure:Notes:Purpose: Adjust the gun deflection coils such that the electron beam travels straight down the optical axis through theChanging spot size will not cause beam to shift. Procedure:Notes.http://clubelsendero.com/img_pag/eos-d20-manual.xml It may be nessessary to pePurpose: To decouple the beam tilt and beam shift operations, meaning that beam tilt will not occur when the beam isImportant for high resolution imaging in which a beam tilt would result in a change in rotationProcedure:Notes. The compensator will have to bePurpose: To ensure that the beam entering the objective system is parallel to the optical axis. This will minimizeProcedure:Purpose: Important for minimizing specimen shift when tilting, proper alignments later, and more accurateMethod 1: diffraction methodMethod 2: alpha wobblerMethod 3: eucentric focusNotes:Purpose: To ensure that the beam is along the optical axis of the objective lens. Such that changes in the objectiveProcedure:Notes:Purpose: To correct the non-uniformity in the focal length of the objective lens by setting the stigmators toMethod 1: Without cameraMethod 2: With cameraThis is very important forNotes. It may alsoFor these reasons it isPurpose: Convenience, a rough alignment of the column can be obtained byThis reduces theProcedure: Alignment FileThere is a list of current files available.Procedure: FEG RegisterNotes:TEM AnalysisFocus is a measurement of how far the image plane is from the specimen plane. When the image plane is above theWhen the imageIn some cases it may be difficult to determine the current focus condition. The current focus condition manifests in theUnder-focused images will have a bright fresnel fringe and airy rings of finiteIn-focus images will have no fresnel fringe and airy rings of infinite radius in theThere are a few important focus values for certain types of analysis. For normal imaging it is best to operate theIn the Image Status window noteThis can be especially true whenIntegration time.https://skazkina.com/ru/difference-between-manual-therapy-and-massage Notes:When entering diffraction mode (by pressing the diffraction button) the microscope changes the projection lens currentA diffraction pattern is a picture of the distributionThere are several different types of diffraction patterns that can be producedProcedure: Selected Area DiffractionSee Zone axis procedure.Procedure: Diffraction AstigmatismNotes:If the pattern is stillThe zone axis is a direction along the intersection of two or more crystallographic planes. Diffraction patterns areMethod 1: Kikuchi Pattern (For Thick Specimens). Kikuchi patterns enable the accurate determination of crystal orientation. They allow the user to easily get a sense ofThis pattern results from multiple scatteringThe intersection of the bands within the pattern represent aMethod 2: Tilt with BF imageMethod 3: Tilt with SAED patternNotes:When all of the diffracted beams are excluded from the final image using the objective aperture the result will be aProcedure:Notes. In bright field theDark field imaging occurs when the objective aperture is used to select a diffracted beam to form the final image. ThisBright regions will correspond to areas whichCentered Dark Field:This imaging mode of the microscope allows the examination on the atomic scale. Contrast results from differences inSimilar to SAED this method can be used to determineProcedure:Notes:Chapter 4. STEM Alignments. Scanning Transmission Electron Microscopy is an operating mode available in the Tecnai F-20 instrument. In thisDue to the change in operatingPurpose: To ensure that the beam is along the optical axis of the objective lens. Minimize lens aberrations and imageProcedure:Notes:Purpose: Proper alignment of the pivot points in STEM mode is essential to eliminate image distortions and ensureThis process will decouple the beam tilt and shift. Procedure:Ronchigram. Also referred to as the Gabor hologram or central zero-order disc of the convergent beam electron diffraction pattern. Looking at this pattern provides the best way of precisely aligning the microscope in STEM (nanoprobe) mode. ThisIt is a useful picture showing the manifestation of spherical aberrations in the electronProcedure: STEM Condenser AstigmatismProcedure: STEM Condenser ApertureProcedure:This detector generates an image from the diffracted electrons exiting the specimen. In addition to diffraction contrast. Z contrast is also possible. Procedure:Notes:Chapter 5. STEM AnalysisProcedure:STEM imaging panel.The Tecnai is equipped with an EDAX EDS system with ultra-thin window. This instrument is capable of examiningProcedure. This will maximize the EDS signal.Notes. Dead times falling outside of this range will resultDead times can be reduced byProcedure:A larger box will increase the acquisition time.AnalysisHold down the alt key, click and dragNotes. Procedure:Notes:Gatan Image FilterWhen the electron beam passes through the specimen it losses energy through a variety of different processes. These inelastically scattered electrons contain additional information about the specimen. The GIF system is used toThe energy distribution of this signal contains a large amount of information aboutThis technique is considered complimentary to EDSA series of magnetic lensesImages are captured using the. Gatan DigitalMicrograph and the Filter Control software. The GIF system is extremely sensitive to external interference. Small changes in the surrounding electromagneticFor this reason it is recommended to use to theThere is a field cancellation system around the roomThe GIF must be aligned precisely in order for it to function. Any change in the conditions within the microscope willA smaller condenser aperture will improve the spherical and chromatic aberrations but at theThis procedure must be preformed at the beginning of the session and every time the magnification or other opticalThe GIF system comes with a set of scripts which will perform most of the alignmentsProcedure:It may ask you to adjustThis process will take 3-5It may ask you to adjustThis procedure will allow the user to adjust the lenses within the spectrometer to optimize the data collection. ThisProcedure:These next alignments are preformed using the Filter Control software in the Adjustments window. Double clickThe scroll wheel adjusts the sensitivity of theNotes:This section covers the different methods of spectrum acquisition. Before acquiring the spectrum align the GIFProcedure:As the energy loss increases the signal decreasesNotes:Procedure:Notes:The microscope can be configured to simultaneously obtain an EELS spectra while generating an ADF STEM image. This allows the user to generate EELS data from small volumes while correlating it to an image. Procedure:See procedure 4.4.2Notes. There is a delicate balance between intensityIt is always better to start with less current (higher spot size,Energy filtered imaging allows the user to generate images using electrons with specific energies. This technique hasProcedure:Notes:The GIF system can automatically generate elemental maps. This allows the user to generate images whose contrastThis technique yields similar results to EDS maps but with much higher spatialSubtraction routines areProcedure:AutoFilter panel.Use the same value determined during step 2.Notes. Be sure not the damage the GIF CCD.The Gatan DigitalMicrograph software comes with several different functions that are useful for analyzing spectra. TheAdditional plugins are available online.Edges of interest are often small compared to the background signal. It is easier to interpret the spectrum after thisProcedure:Notes:The resulting spectra can be modeled as a convolution between the plural scattering and edge spectra functions. ToIn theory, this method can be used to completelyTwo different methods areMethod 1: Fourier-log. Used on low-loss spectra which contain the ZLP.Method 2: Fourier-ratio. Used on higher-loss spectra where the ZLP is not visible.See procedure 6.5.1AppendixInitial conditions. Condenser ApertureCondenser Astigmatism. Gun Tilt. Gun Shift. Pivot Points. Beam Shift. Eucentric Height. Rotation Center. Objective AstigmatismC2: Any. Gun Lens: 1-5. Spot Size: 1. Focus: Slightly under-focused, Obj. Lens Element. Edge Energy (eV)Element. Peak Energy (keV)ADF Annular Dark Field. BF Bright Field. CBED Convergent Beam Electron Diffraction. CCD Charge Coupled Device. DF Dark Field. DP Diffraction Pattern. EDS Energy Dispersive Spectroscopy. EELS Electron Energy Loss Spectroscopy. EFTEM Energy Filter Transmission Electron Microscopy. FFT Fast Fourier Transform. GIF Gatan Image Filter. HRTEM High Resolution Transmission Electron Microscopy. IGP Ion Getter Pump. ROI Region Of Interest. SAED Selected Area Electron Diffraction. TIA Tecnai Imaging and Analysis. ZLP Zero Loss PeakThis function is usefulBeam Shift Trackball Trackball located onIt allows theControl pad There are two control pads to onThey each containDark field The dark field button located onPressing thisDiffraction The diffraction button located onEucentric focus This button is located onFocus This knob is located on the right controlIn STEM mode it controls the position of the spotIntensity This knob is located on the leftAdjusting this will changeL1 Reset defocus. L2 Alpha wobbler. L3 Reduce spot size. Magnification There are severalMultifunction There is one multifunctionTo check the currentDo not pressR1 Screen Lift. R2 Toggle micro between nanoprobe modes. R3 Increase spot size. Screen lift The button located just to the leftV7 button, will raise the screen without goingSpecimen Shift Trackball This trackball isThe two buttons above the trackball control theSTEM Detectors Located just above the rightPressing the circleTo extract theStigmator This button will change theV7 Close This button located to the left ofWobbler Engages the alpha wobbler on theZ-axis The two z-axis buttons on the right controlAccelerating Voltage The electricalAperture A hole or opening which theThere position isAstigmatism Astigmatism refers to an unevenThere are three differentCondenser, Objective, and Diffraction. Backfocal plane The plane just below theBeam Blanker A deflection coil whichBeam Stop Located on the right of the columnBinning The combination of several pixelsBinoculars These are used for a finerBrightness The current density per unit solidFor most cases this aperture will be left out, inC2 Aperture The second aperture from the topCenter pip The small central ring on theCold Finger Improves the vacuum conditionsColumn The main section of theColumn Valve Also referred to as the V7,Compustage This devices controls the positionCondenser Lens This lens controls the sizeIn STEM modeContrast The difference in intensity betweenCryo-holder Used for holding specimens atDeflection Coil A coil which produces aThis tilt angle isDeflection coils come in pairs so that a pure beamThere are several sets ofDefocus The physical distance between theDiffraction pattern The image of theDiffusion Pump A type of vacuum pumpDouble Tilt Holder This holder enables aDwell Time The amount of time the beamEnergy dispersion Refers to the energy perAdjusting this value will alter the intensity of theEucentric Height Refers to the z position ofExposure Time Exposure time controls theFEG emission A measure of the amount ofField-cancellation system The Tecnai room isThe control box is located on the right side of theField Emission Gun The component of theForward scattered spot Also referred to asThis beam in theGatan Image Filter This system has severalGIF CCD The CCD which forms both EELThis camera isGoniometer The device on the column whichGuassian Defocus Refers to the focusGun Lens An electrostatic lens just below theHigh-tension The voltage applied to the anodesHolder Refers to the device which holdsImage Plane The plane which is being projectedThe position of this planeIn-focus Refers to the focus condition inGuassian defocus. Intensity The amplitude of signal beingHigh intensities will damageKikuchi Pattern Refers to the pattern ofLN2 Dewar The container holding the liquidMicroprobe The normal operating mode of theNanoprobe An operating mode of theAn additionalObjective Aperture This aperture is the thirdIn normal imagingObjective Lens This lens collects andOptical Axis The center of the lenses, apertures,Over-focus Refers to the focus condition inPanel A section in the microscope controlTo adjust thePhosphorous screen For most imaging andPivot Point A point around which the beamProjection Lenses A series of lenses whichRaster Refers to the scanning that is preformedScherzer Defocus Refers to the focusHRTEM image are maximized. This occurs atScintillator The device used to amplify theSelected Area Aperture This is the lowestIn normal imaging modeIn low magnificationSingle Tilt Holder The standard holder usedThis holder only has aSpecimen Plane The plane in which the. TEM specimen is. Spot size Refers to the size of the probe onStage Cover Placed over the compustage toSTEM Detectors When the microscope is in. STEM mode the resulting images are formedStigmator Refers to the device which correctsTab A user defined section under the worksetTurbo A type of vacuum pump used by the. Tecnai microscope. TV Camera This is part of the GIF system andCCD. Images can be viewed on the TV monitor. TV monitor This monitor is hooked up to the. GIF TV camera just before the GIF CCD andIt is used as aCCD is not damaged. Ultra-scan CCD The standard CCD cameraIt is below the phosphorous screen. Under-focus Refers to the focus condition inNow customize the name of a clipboard to store your clips. Bitte wechseln Sie auf eine neuere Version. Besides classical methods (bright field and dark field imaging, selected area and convergent beam diffraction) various analytical methods (EDXS, EFTEM and EELS) as well as tomography are applied at both high spatial and high energy resolution. Furthermore, the microscope can be used in scanning transmission mode (STEM) supported by a novel digiscan unit allowing for high-speed spectrum imaging. The high energy resolution enables the investigation and visualization of different chemical bonds or features in the low loss region such as energy gaps and plasmons. The investigated specimens and materials are diverse as well: steels, ceramics, alloys, biological samples, inorganic and organic semiconductors, devices, polymers, nano particles and many more. Mulai dari Dominoqq, Ceme, Aduqq, Capsa Susun, Sakong, Balak66, Pkv Games, BandarQQ. Semua permainan ini bisa kalian mainkan dengan cara DEPOSIT terlebih dahulu kebank lokal ManiaQQ, seperti BCA, BNI, BRI, DANAMON, MANDIRI, CIMB. Situs PokerSeindo adalah salah satu situs penyedia permainan Poker Online terbaik dengan jaminan permainan paling fair play, player vs player yang membuat peluang anda untuk memenangkan permainan sangat besar idn poker, sehingga kamu bisa menang juga mendapatkan keuntungan besar dalam bermain. Great tomography software for automated acquisition. An easy to use, powerful transmission microscope. This is a lovely microscope for viewing standard T.E.M material. The panel dials are very simple to use and a ten minute tutorial on the microscope will have you using it at its basic levels. The contrast is very good for biological material with a simple structure for changing between apertures. Very easy to use and robust.Easy It’s quick and simple to do Fast Your inquiry will be delivered straight to the manufacturer Free You’re under no obligation Secure We only pass your details on to trusted suppliers at your request Save time Submit your details once and make multiple inquiries. The electron source is provided by a Lanthanum hexaboride (LaB6) crystal or a Tungsten (W) filament (currently a LaB6 is mounted). It offers high performance, versatility, high productivity and ease of operation. The MIC is staffed by research scientists with expertise in Transmission Electron Microscopy, Scanning Electron Microscopy, Light Microscopy, and supporting instruments therein. These staff members are happy to provide quality training and education through one-on-one sessions, short courses, formal courses, open house seminars, and more. Samples can be prepared by flash freezing in our FEI Vitrobot, Leica High Pressure Freezer or Leica Cryo-Microtome and maintained at temperatures below -170oC while being examined. A suite of software applications are available including those for tomography and collecting cryo-temperature tilt series. The precise nature of the specimen stage allows for quick scanning of specimen grids and exact recall of areas of interest - especially valuable to researchers collecting large data sets for Single Particle Analysis. This TEM is also fitted with a bottom mount Gatan 4k CCD. IP3, IP1 and P3should all be in good ranges. This is important for cryo session. When it is IN, the “aperture” indicator points to position “1”, close to horizontal direction. This is absolutely needed for a serious cryo session. Ask Chen if there isn’t one available. This should be in the order: You might want to check rotation center at this point too. Tomography user may skip this step. This should be done at a mag higher than SA range. The bright spot should be sharp and close to the center of the whole crossed beam. Otherwise, perform gun alignment procedure. This step might also concern tomography user, as if the gun tilt is off too much the beam intensity cross gradient could cause sharp border between montage pieces. Either specimen rod is in retracted position or there is a hole or broken area that is large than the CCD area.Therefore, it is perhaps not a bad idea to use the native controlling software to prepare the gain reference. You can ask SerialEM to use that.This is needed for “CenterBeamFromImage” routine to work nicely. The IS offset only works for the specific mags of R and V. If down the road, you change the mag of V or R, you need to recheck this. I would wait until IGP1 And then quiet the bubbling. The main reason is that wobbling the stage will likely introduce LN2 bubbling again in the dewar of 626 side-entry cryo holder.Aperture out, set C2 to 100. It is a good time to check if the cryoBox is centered. Close the stack file. Indeed, we can by taking advantage of macro. After defining the filename for the montage, the stage will go to (0,0) by itself.With current geometry of the grid, set “Focus” position. Double check if the V and R mags are aligned still. Don’t forget to put back Obj Aperture in and center it. Check the Obj stigmation at this point. And you might want to “align” the images between V (e.g. 3000X) and mag at which the grid overview map is created (e.g. 140X) using “shift to marker” under navigator. Here is an example: If it works fine, then the hard part is done. Congratulations. Grid Preparation: Edwards Auto 306 — Turbo-pumped carbon evaporation system. This tool creates a clean, hydrophilic and non-reactive surface which is needed for making frozen-hydrated grids of labile macro-molecular complexes. Gatan Solarus — This plasma cleaning device creates a clean hydrophilic surface for our frozen- hydrated samples. Pelco easiGlow 9100 — This plasma cleaning device creates a clean hydrophilic or hydrophobic surface for our frozen hydrated samples. Manual cryo plunging unit — With this hand-built apparatus, frozen-hydrated samples are produced by manual two-sided blotting, and release of a gravity-operated plunger. Since humidity and temperature are not controlled, reproducibility is not strictly ensured. FEI Vitrobot Mark IV Vitrification Robot — This cryo-plunging system, allows control of parameters such as blotting time, relative humidity and temperature for reproducible results even by inexperienced users. Gatan CP3-GB Vitrification system — Users of this cryo-plunging system can choose one- or two- sided blotting and can set the blotting time. The humidity can be monitored and the cryogen temperature regulated with this system. Electron Microscopes: FEI Tecnai F20 — Cryo TEM with Gatan 4x4k Ultrascan CCD camera and CT3500 and Gatan 914 High tilt cryo-transfer systems. This microscope operates with voltages up to 200 kV and has a highly coherent electron FEG source for high-resolution data collection from frozen-hydrated samples. A number of software packages have been installed to allow automated data collection. FEI Tecnai Polara F30 — Cryo TEM with Gatan K2 Summit direct electron counting camera. This microscope operates with voltages up to 300 kV and is capable of operating at liquid helium or liquid nitrogen temperatures. As the F20 it is equipped with a highly coherent FEG source. The instrument has a very stable cartridge style system that allows up to 6 samples to be loaded at once for screening. Once the best sample has been found, data can be collected for multiple days with little contamination or operator intervention using the program Leginon. Vibration and field canceling systems are also installed. Software for Data Collection on the Microscopes: Leginon AutoEMation SerialEM UCSF Image Gatan Microscopy Suite Data Digitization and Screening: With the installation of the Gatan K2 Summit our lab no longer collects on film but we still have the systems below available. SIRA Digital diffractometer. Micrographs on film can be quickly screened for image quality using this apparatus. Three Nikon Super Coolscan 9000ED Film Scanners Data Processing: A. Software SPIDER RELION EMAN2 XMIPP B. Computing Facilities Micrograph Storage Server — Micrographs generated from Gatan K2 direct director are sent to Catalina server via a 10Gb high through put direct Ethernet connection. Catalina can store up to 33TB of data in raid 6 configuration which can tolerate two concurrent hard drive failures. This server handles tasks such as CPU frame alignment, automated particle picking, defocus calculation, etc. These instruments are suitable for high-end work in both the biological (proteins, vesicles, viruses, bacteria, phages, DNA, thin sections of plant, animal tissue and inorganic material, etc) and material sciences (nanoparticles, metal alloys, polymers, ceramics etc). Specialist techniques: cryo-TEM, tomography, EDX, electron diffraction and energy filtered imaging are available on either or both these instruments. For TEM applications, new users are instructed individually by Mohamed Jaffer (the EM Officer responsible for TEM) or their supervisors.Beam sensitive samples are imaged using the low dose imaging technique. It is capable of giving spectra that indicate which elements are present in the area illuminated by the electron beam. This can be done quantitatively and at the local scale, at the same high magnifications that the TEM can achieve. STEM is not available on this instrument. It is a direct detection TEM camera, featuring continuous streaming at up to 92 frames per second, enabling TEM experiments that were not previously possible on a CCD based detector. It also has a 2048 x 2048 integrated near-axis fiber-coupled survey sensor and an integrated Faraday plate for electron exposure measurement. This flexibility allows for the acquisition of high-resolution images in both the biological and materials sciences and allows in situ experiments, low-dose imaging, single particle cryo-EM and tomography to be performed. It comes with the propriety DE software suite. ImageJ and SerialEM are available as well. The TEM can also be operated at lower accelerating voltages down to 80kV. Energy filter imaging (EFTEM) and energy loss spectroscopy (EELS) can be performed using the Gatan Tridium GIF system.